Electrical Engineering MA, Imaging Metrology, 7.5 credits

Aim

The aim of the course is to provide an overall insight into machine vision systems, and how these can be used to measure selected parameters and classify imaged surfaces or volumes. Furthermore, algorithms for processing and analysis of images and how machine vision systems are modeled are treated.

Course objectives

After completion of the course the student shall be able to:

- Select a machine vision based optical measurement method for acquisition of 2D or 3D objects,
- Describe methods for spectral and hyperspectral imaging,
- Describe the optics required for a given problem and chosen measurement method,
- Select a camera from a given problem description,
- Design and model functions for image processing and analysis of selected objects. These functions can consist of: pre-processing, frequency analysis, segmentation, morphology, labeling, and analysis of objects,
- Examplify how cameras and artificial intelligence can be used to characterize properties of an area/volume.

Content

The course includes:

- Introduction,
- Camera technology and machine vision systems,
- Active illumination ( diffuse, directed, structured and polarised sources ),
- Optical components, lenses and filters,
- Imaging in 2D and 3D,
- Camera calibration,
- Image analysis (image reconstruction, frequency analysis, segmentation, morfology, object analysis),
- Spectral and hyperspectral imaging.

Entry requirements

Electrical Engineering BA 45 credits and Computer Engineering BA 5 credits, including basic imperative programming, and Mathematics BA 15 credits, including Fourier and Laplace transforms

Selection rules and procedures

The selection process is in accordance with the Higher Education Ordinance and the local order of admission.

Teaching form

Laborations, lectures, and guided self studies.

Examination form

L101: Laborations with oral presentation, 3.5 Credits
Grade scale: Fail (U) or Pass (G)

T101: Written exam, 4 Credits
Grade scale: Seven-grade scale, A, B, C, D, E, Fx and F. Fx and F represent fail levels.

Grading criteria for the subject can be found at www.miun.se/gradingcriteria.

The examiner has the right to offer alternative examination arrangements to students who have been granted the right to special support by Mid Sweden University’s disabilities adviser.

Examination restrictions

Students are entitled to three examination opportunities within one year according to the examination format given in this version of the course syllabus. After the one-year period, the examination format given in the most recent version of the course syllabus applies.

Grading system

Seven-grade scale, A, B, C, D, E, Fx and F. Fx and F represent fail levels.